Corrigendum to “Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy” [J. Non-Cryst. Solids 357 (2011) 3602–3615]

✍ Scribed by King, S.W.; Bielefeld, J.; French, M.; Lanford, W.A.

• Book ID: 121324095
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 99 KB
• Volume: 378
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2013.06.021