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Correlation of surface morphology and chemical state of Si surfaces to electrical properties

✍ Scribed by P.O. Hahn; M. Grundner; A. Schnegg; H. Jacob


Book ID
103615300
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
995 KB
Volume
39
Category
Article
ISSN
0169-4332

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## Abstract In this work we revealed correlation between presence of surface defects and peculiarities in ellipsometric spectra and hence in optical properties of AlN films grown by ammonia MBE technique. We propose to use this fact for the fast and non‐destructive checking of film quality. Princip