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Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers

✍ Scribed by J. Ben Youssef; K. Bouziane; O. Koshkina; H. Le Gall; M. El Harfaoui; M. El Yamani; J.M. Desvignes; A. Fert


Book ID
114227216
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
253 KB
Volume
165
Category
Article
ISSN
0304-8853

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