✦ LIBER ✦
Characterisation of interfacial properties in sputtered Co/Cu multilayers: X-ray reflectometry compared with TEM and AFM
✍ Scribed by J Langer; J Kräußlich; R Mattheis; St Senz; D Hesse
- Book ID
- 114229678
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 284 KB
- Volume
- 198-199
- Category
- Article
- ISSN
- 0304-8853
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