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Correlation of Charge Buildup and Stress-Induced Leakage Current in Cerium Oxide Films Grown on Ge (100) Substrates

✍ Scribed by Evangelou, E.K.; Rahman, M.S.; Dimoulas, A.

Book ID: 114619333
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 293 KB
Volume: 56
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.2011935

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