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Correlation between silicon nanocrystalline size effect and spectroscopic ellipsometry responses

✍ Scribed by A. En Naciri; M. Mansour; L. Johann; J.J. Grob; C. Eckert


Book ID
113936706
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
146 KB
Volume
455-456
Category
Article
ISSN
0040-6090

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