✦ LIBER ✦
The grain size in microcrystalline silicon: correlation between atomic force microscopy, UV reflectometry, ellipsometry, and X-ray diffractometry
✍ Scribed by E. Bardet; J.E. Bourée; M. Cuniot; J. Dixmier; P. Elkaim; J. Le Duigou; A.R. Middya; J. Perrin
- Book ID
- 115991100
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 355 KB
- Volume
- 198-200
- Category
- Article
- ISSN
- 0022-3093
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