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Correlation between microstructure, electronic properties and flicker noise in organic thin film transistors

✍ Scribed by Jurchescu, Oana D.; Hamadani, Behrang H.; Xiong, Hao D.; Park, Sungkyu K.; Subramanian, Sankar; Zimmerman, Neil M.; Anthony, John E.; Jackson, Thomas N.; Gundlach, David J.

Book ID: 126980166
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 384 KB
Volume: 92
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2903508

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Understanding how electrons travel through organic matter is important in designing materials for organic microelectronics [1] and understanding biological electron-transport processes. [2,3] Herein we describe a simple experimental procedure to measure rates of electron transport across organic thi