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Correlation between interface state properties and electron transport at ultrathin insulator/Si interfaces

✍ Scribed by Tatsuo Shiozawa; Toshiyuki Yoshida; Tamotsu Hashizume; Hideki Hasegawa

Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
197 KB
Volume
159-160
Category
Article
ISSN
0169-4332

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