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Correlation between Emission Spectra and Defect Position in InGaN-Based Light Emitting Devices

✍ Scribed by F. Hitzel; S. Lahmann; U. Rossow; A. Hangleiter


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
660 KB
Volume
0
Category
Article
ISSN
1862-6351

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## Abstract Triplet–triplet annihilation (TTA) is studied in a wide range of fluorescent host:guest emitter systems used in organic light‐emitting devices (OLEDs). Strong TTA is observed in host:guest systems in which the dopant has a limited charge‐trapping capability. On the other hand, systems i