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Correlation between electroluminescence and charge trapping in multi-color Eu implanted Si-based light-emitting diodes

โœ Scribed by A.N. Nazarov; I.P. Tyagulskyy; S.I. Tyagulskiy; L. Rebohle; W. Skorupa; J. Biskupek; U. Kaiser


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
697 KB
Volume
41
Category
Article
ISSN
1386-9477

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Correlation of charge trapping and elect
โœ T. Gebel; L. Rebohle; J. Sun; W. Skorupa; A.N. Nazarov; I. Osiyuk ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 204 KB

In this paper we report on recent results on charge trapping and electroluminescence (EL) from Ge rich SiO2 layers. Thermally grown 80 nm thick SiO2 layers were implanted with Ge ions at energies of 30 -50 keV to peak concentrations of 1-6 at%. Subsequently rapid thermal annealing was performed at 1