𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Corrections to “Challenges Related to Reliability in Nano Electronics”

✍ Scribed by Kuo, W.


Book ID
114668513
Publisher
IEEE
Year
2007
Tongue
English
Weight
21 KB
Volume
56
Category
Article
ISSN
0018-9529

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Empirically identifying factors related
✍ Eugene W. Wang; Pamela M. Diamond 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 158 KB

The authors used structural modeling to predict institutional aggression among male mentally ill oenders using the predictors of anger, antisocial personality style, current violent oense, ethnicity, and impulsivity. Measures included the Barratt Impulsiveness Scale, the Buss-Perry Aggression Questi