Advanced Experimental and Simulation Approaches to Meet Reliability Challenges of New Electronics Systems

✍ Scribed by Dietmar Vogel; Jürgen Auersperg; Bernd Michel

• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 871 KB
• Volume: 11
• Category: Article
• ISSN: 1438-1656
• DOI: 10.1002/adem.200800330