Correction to "Measurement of diffusion length, lifetime, and surface recombination velocity in thin semiconductor layers"

✍ Scribed by Gonzalez, F.N.; Neugroschel, A.

• Book ID: 114595353
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 124 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22306