✦ LIBER ✦

Correction for the effects of adventitious carbon overlayers in quantitative XPS analysis

✍ Scribed by Evans, Stephen

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 258 KB
Volume: 25
Category: Article
ISSN: 0142-2421
DOI: 10.1002/(sici)1096-9918(199711)25:12<924::aid-sia317>3.0.co;2-2

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✦ Synopsis

A data processing procedure is described that enables the energy-dependent attenuation of the substrate XPS signals from typical samples exhibiting adventitious carbon contamination to be objectively and quantitatively compensated when obtaining elemental analyses from the XPS peak intensities. The procedure is based on wellestablished theory for a uniform overlayer on a homogeneous substrate, and is evaluated using two representative substrates : oxidized sheet zinc and pressed pellets of sodium Ñuoride. Suitable values for key parameters are recommended, and an application program in MS-DOS Q-BASIC is available via the Internet.

1997 John ( Wiley & Sons, Ltd.

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