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Correction factors for the four-point probe resistivity measurement on cylindrical semiconductors

✍ Scribed by Helen H. Gegenwarth

Publisher: Elsevier Science
Year: 1968
Tongue: English
Weight: 205 KB
Volume: 11
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(68)90060-9

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