Cordierite-Based Dielectric Thick Films on an Oxidized Copper Layer: Microstructural Evidence of Copper Diffusion

✍ Scribed by Yong S. Cho; David T. Hoelzer; Walter A. Schulze; Vasantha R. W. Amarakoon

• Book ID: 110827865
• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 544 KB
• Volume: 82
• Category: Article
• ISSN: 0002-7820
• DOI: 10.1111/j.1151-2916.1999.tb02025.x