✦ LIBER ✦
ChemInform Abstract: Cordierite-Based Dielectric Thick Films on an Oxidized Copper Layer: Microstructural Evidence of Copper Diffusion.
✍ Scribed by Yong S. Cho; David T. Hoelzer; Walter A. Schulze; Vasantha R. W. Amarakoon
- Publisher
- John Wiley and Sons
- Year
- 2010
- Weight
- 31 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0931-7597
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