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Convergence of Microscopy Techniques : An Application to Dislocation Pit Characteristics in AllnN

✍ Scribed by Anas Mouti

Publisher: Wiley (John Wiley & Sons)
Year: 2009
Weight: 469 KB
Volume: 11
Category: Article
ISSN: 1439-4243
DOI: 10.1002/imic.200990042

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✦ Synopsis

A simple illustration of how useful a combination of microscopy techniques can be is provided in what follows, as results of TEM, SEM, AFM and STEM EDX are added up to describe dislocation pits. AFM in tapping mode fails to measure their depth but shows greater details of lower amplitude topography variations, while TEM in weak-beam mode provides an accurate measurement of pit depths and relates them directly to dislocations. Finally STEM-EDX provides chemical analysis of their vicinity.

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An application of high-resolution transmission electron microscopy (HRTEM) to the study of two types of dislocations in potassium feldspars (K-feldspars) is shown here. HRTEM images were submitted to a filtering in order to improve their interpretation. One type of dislocation4010)[001l-appears to b