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An application of high-resolution transmission electron microscopy to the study of the fine structure of dislocations in potassium feldspars

✍ Scribed by Zheng, Yuanlin ;Gandais, Madeleine

Publisher: Wiley (John Wiley & Sons)
Year: 1989
Tongue: English
Weight: 398 KB
Volume: 11
Category: Article
ISSN: 0741-0581
DOI: 10.1002/jemt.1060110309

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✦ Synopsis

An application of high-resolution transmission electron microscopy (HRTEM) to the study of two types of dislocations in potassium feldspars (K-feldspars) is shown here. HRTEM images were submitted to a filtering in order to improve their interpretation. One type of dislocation4010)[001l-appears to be dissociated. with ( 010)[0011/2 planar defect, whereas the Dissociation, Planar defect, Modelling, Core energies other one-(010)[1101/2-~s~ perfect. This result activation in this material.

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