A simple optical method for determination of thicknesses of organic layers on solid substrates is described. The method is based on the use of a substrate with a high refractive index, e.g., silicon, and reflection of light at an angle of incidence close to the pseudo-Brewster angle. Under these con
✦ LIBER ✦
Convergence of a reflection method for diffusion-controlled reactions on static sinks
✍ Scribed by S.D. Traytak
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 224 KB
- Volume
- 362
- Category
- Article
- ISSN
- 0378-4371
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