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A reflectance method for quantification of immunological reactions on surfaces

✍ Scribed by Hans Arwin; Ingemar Lundström

Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
540 KB
Volume
145
Category
Article
ISSN
0003-2697

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✦ Synopsis

A simple optical method for determination of thicknesses of organic layers on solid substrates is described. The method is based on the use of a substrate with a high refractive index, e.g., silicon, and reflection of light at an angle of incidence close to the pseudo-Brewster angle. Under these conditions, a reflectance minimum is obtained for light polarized in the plane of incidence. The presence of an organic layer on the surface will increase the reflectance, which is used to determine the thickness of the layer. The physical basis of the method is described briefly, and the application to immunology is demonstrated. o 1985 Academic PIUS, IX.

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