Controlling the Leakage-Current of Low Temperature Germanium Detectors Using XeF(_{2})Dry Etching

✍ Scribed by Marnieros, S.; Bergé, L.; Broniatowski, A.; Drillien, A. A.; Dumoulin, L.; Holtzer, N.; Olivieri, E.; Piro, M. C.; Rigaut, O.

• Book ID: 121583794
• Publisher: Springer US
• Year: 2013
• Tongue: English
• Weight: 430 KB
• Volume: 176
• Category: Article
• ISSN: 0022-2291
• DOI: 10.1007/s10909-013-0997-0