Control of electrostatic discharge damage to semiconductors : E. R. Freeman and J. R. Beall. Proc. IEEE Reliab. Phys. Symp. 304 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 134 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90512-0