✦ LIBER ✦
Reliability study of an N-channel silicon gate FET with field shield : E. S. Anolick, J. F. Prosser and B. R. Remis. Proc. IEEE Reliab. Phys. Symp. 70 (1974)
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 134 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2714
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