๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Contrast within images of locally charged dielectrics in scanning electron microscopy

โœ Scribed by Rau, E. I.; Tatarintsev, A. A.

Book ID
119883669
Publisher
Pleiades Publishing
Year
2012
Tongue
English
Weight
782 KB
Volume
6
Category
Article
ISSN
1027-4510

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Scanning electron microscopy imaging of
Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast
โœ Martin A. Crimp ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 443 KB

## Abstract The imaging and characterization of dislocations is commonly carried out by thin foil transmission electron microscopy (TEM) using diffraction contrast imaging. However, the thin foil approach is limited by difficult sample preparation, thin foil artifacts, relatively small viewable are