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Continuous-wave scanning terahertz near-field microscope

✍ Scribed by J.-P. Guillet; L. Chusseau; R. Adam; T. Grosjean; A. Penarier; F. Baida; D. Charraut

Book ID
102950716
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
615 KB
Volume
53
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

A versatile cw measurement setup for terahertz near‐field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a Ξ»/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates. Β© 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:580–582, 2011; View this article at wileyonlinelibrary.com. DOI 10.1002/mop.25754

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like a PMC surface for this direction of observation. It can also be noted that the fields are zero for Ο­ /2, except when Ο­ 0 and Ο­ . Thus, the field will propagate along the surface in the direction of the strips, that is, in the direction for which the surface behaves like a hard surface. This cor