Contact transport of focused ion beam-deposited Pt to Si nanowires: From measurement to understanding

✍ Scribed by Ke, J. J.; Tsai, K. T.; Dai, Y. A.; He, J. H.

• Book ID: 121823272
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 982 KB
• Volume: 100
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3680251