Contact potential measurements on thin SIO2 films : M. Bess, R. Oswald and M. Ohring. Solid St. Electron.17, 813 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 119 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90416-3