๐”– Bobbio Scriptorium
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Contact potential difference and surface photovoltage measurements on hydrogenated amorphous silicon

โœ Scribed by M. Foller; W. Beyer; J. Herion; H. Wagner

Publisher
Elsevier Science
Year
1986
Weight
68 KB
Volume
178
Category
Article
ISSN
0167-2584

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Experimental techniques used to measure structural parameters of thin films such as thickness, density, and coverage provide important insights into the physical properties of these films. Structural parameters are also often used to predict the eventual performance of thin films. In this study, we