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Configurable monitoring system for industrial process control

✍ Scribed by Guohui Zhang; Youping Chen; Chuming Yuan; Zude Zhou


Publisher
Springer
Year
2006
Tongue
English
Weight
509 KB
Volume
29
Category
Article
ISSN
0268-3768

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We present a framework for monitoring, diagnosis, and control of industrial processes. This framework utilizes the multiresolution analysis capability of wavelet theory. Wavelet coefficient patterns at different scales, under a variety of process conditions, are noted to form process f'mgerprints, t