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Conduction mechanism of leakage current due to the traps in ZrO 2 thin film

โœ Scribed by Seo, Yohan; Lee, Sangyouk; An, Ilsin; Song, Chulgi; Jeong, Heejun


Book ID
120384380
Publisher
Institute of Physics
Year
2009
Tongue
English
Weight
335 KB
Volume
24
Category
Article
ISSN
0268-1242

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