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Conductance measurements of nanoscale regions with in situ transmission electron microscopy

✍ Scribed by Masashi Arita; Ryusuke Hirose; Kouichi Hamada; Yasuo Takahashi

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
386 KB
Volume
26
Category
Article
ISSN
0928-4931

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✦ Synopsis

Conductance measurements of nanostructures with simultaneous transmission electron microscopy (TEM) were performed on thin insulating SrF 2 films (3 nm thick) and Fe -SrF 2 granular films (10 nm thick) deposited on tip-shaped Au electrodes. By using a movable counter electrode, nanoscale regions were selected for investigation. Systematic measurements taken during the deformation of the SrF 2 film by the counter-electrode provided a tunnelling barrier height of about 2.5 eV. The conductance of Fe -SrF 2 in nanoscale (Β¨500 nm 2 ) showed the Coulomb staircase like characteristics at room temperature. The staircase period approximately corresponded to the value estimated from the geometry observed by TEM. The feasibility of this method is briefly described.

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