Conductance Calculations for Real Systems on the Nanoscale
✍ Scribed by Frank Grossmann; Rafael Gutiérrez; Rüdiger Schmidt
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 316 KB
- Volume
- 3
- Category
- Article
- ISSN
- 1439-4235
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📜 SIMILAR VOLUMES
The resistance of a wire consisting of a line of 3 Mg atoms between two macroscopic metallic electrodes is calculated as a function of the displacement of the center atom laterally out of the line. A displacement of somewhat over 3 Å increases the resistance by a factor of ∼10. This contrasts with t
This paper presents a test system for conducting on-line tests in a real time and a series of real-time on-line tests conducted to verify the effectiveness of the system. The proposed system is characterized by (1) use of a Digital Signal Processor (DSP) now readily available, (2) adoption of the C
## Abstract In this paper, a method for computing the capacitance and conductance matrices of multiconductor IC interconnects in a multilayered dielectric region is presented. The number of conductors and the number of dielectric layers are arbitrary. The conductors are very thick (as usual for on‐