✦ LIBER ✦

Conditionally robust two-pattern tests and CMOS design for testability

✍ Scribed by Sherlekar, S.D.; Subramanian, P.S.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

CMOS fault modeling, test generation and

✍ C Matthäus; B Krüger-Sprengel; C Glowacz; U Hübner; H.T Vierhaus 📂 Article 📅 1988 🏛 Elsevier Science ⚖ 406 KB

Advanced Circuits for Emerging Technolog

✍ Iniewski, Krzysztof 📂 Article 📅 2012 🏛 John Wiley & Sons, Inc. ⚖ 533 KB