This paper surveys the various high-level design for testability and synthesis for testability methods that have been proposed in the last decade. We begin with a description of high-level synthesis methods which target the ease of subsequent gate-level sequential test generation. Then we describe h
โฆ LIBER โฆ
Concurrent testing in high level synthesis
โ Scribed by A.A. Ismaeel; R. Bhatnagar; R. Mathew
- Book ID
- 108361746
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 375 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.
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