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Concentration of synchrotron beams by means of monolithic polycapillary X-ray optics

✍ Scribed by J.B. Ullrich; K.G. Huang; S.M. Owens; D.C. Aloisi; F.A. Hofmann; N. Gao; I.L. Klotzko; W.M. Gibson

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
576 KB
Volume
364
Category
Article
ISSN
0168-9002

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The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering