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Computerized ultrasonic testing of MIC capacitors by impulse count method and image processing technique : He Feng Qi. Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1599–1601. Edited by J. Boogaard and G.M. van Dijk, Elxevier, 1989

Publisher: Elsevier Science
Year: 1990
Weight: 171 KB
Volume: 23
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(90)90155-h

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