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Computer simulation of field ion images

✍ Scribed by R.C. Sanwald; J.J. Hren


Book ID
118979580
Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
617 KB
Volume
7
Category
Article
ISSN
0039-6028

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## Abstract A procedure has been developed which enables computer‐simulated electron micrographs of defects in crystalline foils to be constructed that are, photographically speaking, virtually indistinguishable from the corresponding experimental micrographs. The intensity variations in the image