The aim of this work was to investigate whether total reflection x-ray fluorescence (TXRF) is a satisfactory technique for the determination of trace element concentrations in fine roots. Fine roots in diameter classes <1 and 1-2 mm from Scots pine (Pinus sylvestris L.) were used. The roots were col
Computer analysis of multi-channel SEM and X-ray images from fine particles
β Scribed by E.W. White; K. Mayberry; G.G. Johnson Jr.
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 1006 KB
- Volume
- 4
- Category
- Article
- ISSN
- 0031-3203
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