A procedure is described to e.ciently obtain the complex dielectric permittivity of semi! conductor materials with numerical routines available in current software applications[ This procedure calculates the real component of the dielectric permittivity from its imaginary component by making use of
β¦ LIBER β¦
Computational analysis of the surface permittivity and charging of dielectrics with the SEM-mirror technique
β Scribed by Sudarshan, T.S.; Wang, J.
- Book ID
- 114533065
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 822 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0018-9367
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