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Numerical computation of the complex dielectric permittivity using Hilbert transform and FFT techniques

✍ Scribed by Francisco Castro; Bahram Nabet

Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
360 KB
Volume
336
Category
Article
ISSN
0016-0032

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✦ Synopsis

A procedure is described to e.ciently obtain the complex dielectric permittivity of semi! conductor materials with numerical routines available in current software applications[ This procedure calculates the real component of the dielectric permittivity from its imaginary component by making use of the Hilbert transform properties of the KramersÐKronig relations[ We show the reliability of this approach by reconstructing the real component from the experimentally known dispersion relations of GaAs and InAs[ In addition\ we use this procedure for the case when the imaginary component is obtained from analytical expressions as is the case for the FranzÐKeldysh e}ect in the absorption of photons in GaAs[ We show how the spectral photore~ection of structures where this e}ect is present can be easily modeled and simulated by this method[ Þ 0887 The Franklin Institute[ Published by Elsevier Science Ltd

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## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o