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Comprehensive analysis of reverse short-channel effect in silicon MOSFETs from low-temperature operation

✍ Scribed by Szelag, B.; Balestra, F.; Ghibaudo, G.

Book ID: 111910798
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 72 KB
Volume: 19
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.735763

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