Completely Quantum–Mechanical Extraction of Equivalent Oxide Thickness of PMOS Gate Insulator

✍ Scribed by Hiraiwa, A.; Shima, A.; Ishikawa, D.

• Book ID: 114620333
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 353 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2098479