✦ LIBER ✦
Quantum C-V modeling in depletion and inversion: accurate extraction of electrical thickness of gate oxide in deep submicron MOSFETs
✍ Scribed by Wuyun Quan; Kim, D.M.; Hi-Deok Lee
- Book ID
- 114539082
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 286 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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