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Complementary neutron and X-ray reflectivity for structural characterization of porous thin films

✍ Scribed by Yu-Shan Huang; U-Ser Jeng; Chia-Hung Hsu; Naoya Torikai; Hsin-Yi Lee; Kwanwoo Shin; Masahiro Hino

No coin nor oath required. For personal study only.

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