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Comparison of the thermal stability of single Al2O3 layers and Al2O3/SiNx stacks for the surface passiviation of silicon

✍ Scribed by Boris Veith; Florian Werner; Dimitri Zielke; Rolf Brendel; Jan Schmidt


Book ID
116425627
Publisher
Elsevier
Year
2011
Weight
275 KB
Volume
8
Category
Article
ISSN
1876-6102

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