Comparison of the 3ω method and time-domain thermoreflectance for measurements of the cross-plane thermal conductivity of epitaxial semiconductors

✍ Scribed by Koh, Yee Kan (author);Singer, Suzanne L. (author);Kim, Woochul (author);Zide, Joshua M.O. (author);Lu, Hong (author);Cahill, David G. (author);Majumdar, Arun (author);Gossard, Arthur C. (author)

• Book ID: 120085201
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 476 KB
• Volume: 105
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.3078808