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Comparison of the 3Ï method and time-domain thermoreflectance for measurements of the cross-plane thermal conductivity of epitaxial semiconductors

✍ Scribed by Koh, Yee Kan; Singer, Suzanne L.; Kim, Woochul; Zide, Joshua M. O.; Lu, Hong; Cahill, David G.; Majumdar, Arun; Gossard, Arthur C.

Book ID: 120085200
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 476 KB
Volume: 105
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3078808

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