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Comparison of surface layer analysis techniques

โœ Scribed by J.W. Mayer; A. Turos


Book ID
107859953
Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
609 KB
Volume
19
Category
Article
ISSN
0040-6090

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This article reviews and speculates on the relative capabilities of major techniques for detailed structure determination of surfaces and interfaces. These techniques are primarily low-energy electron diffraction (LEED), x-ray diffraction (XRD), photoelectron diffraction (PD), x-ray absorption fine